Current-Voltage (I-V) Analyzer

Characterization Equipment

This system has electronic circuits, sensitive to very small currents, and is used to characterize the current-voltage (I-V) of electronic elements such as resistor, diode, transistor, etc. To evaluate a transistor performance, the transistor characteristic curves (drain current vs. drain-to-source voltage) should be plotted. In order to characterize the transistor, four channels with the ability to sweep the voltage in a certain way and measure the current with high precision, are needed to be connected to the gate, drain, source and body. In many diode- and resistive-type sensors, the sensor behavior can be evaluated using this device. This instrument is a Source Measure Unit (SMU) type, which its minimum measurable voltage and current are 10 μV and 10 nA, respectively.


Device specifications



Range 1 (Max.): 1.1 V with 100 μV Steps (bipolar)

Range 2 (Max.): 11 V with 1 mV Steps (bipolar)

Range 3 (Max.): 110 V with 10 mV Steps (bipolar)



Resolution 1: 10 μV

Resolution 2: 100 μV

Resolution 3: 1 mV




Range 1 (Max.): 1 mA with 100 nA Steps (bipolar)

Range 2 (Max.): 10 mA with 1 μA Steps (bipolar)

Range 3 (Max.): 100 mA with 10 μA Steps (bipolar)



Resolution 1: 10 nA

Resolution 2: 100 nA

Resolution 3: 1 μA


  • Thickness Measurement

    Unit Each Sample Amount : 450,000 Rls.
  • Thickness Measurement

    Unit Each Sample Amount : 500,000 Rls.