Resistivity Measurement by Four Point Probe

Characterization Equipment

Using this device, the resistivity of thin films is measured based on four point method. Four probes, which are spaced at a distance of about 2 mm from each other, are placed onto the sample; then the device voltage is swept from 1 mV to 10 V, and the current that passes through the sample is read in the range of 0 to 200 mA; and finally by using the conventional formulas the resistivity of thin film is measured. Measurement of resistivity at different temperatures is also possible using this device (maximum up to 200 °C).


  • Measurement

    Unit Each Sample Amount : 300,000 Rls.